Invention Grant
- Patent Title: Abnormal inode dynamic repair method and system, and related component
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Application No.: US17786812Application Date: 2020-08-25
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Publication No.: US11650875B2Publication Date: 2023-05-16
- Inventor: Peng Li , Xiangrui Meng
- Applicant: INSPUR ELECTRONIC INFORMATION INDUSTRY CO., LTD.
- Applicant Address: CN Shandong
- Assignee: INSPUR ELECTRONIC INFORMATION INDUSTRY CO., LTD.
- Current Assignee: INSPUR ELECTRONIC INFORMATION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shandong
- Agency: Cooper Legal Group, LLC
- Priority: CN 1911328598.6 2019.12.20
- International Application: PCT/CN2020/110985 2020.08.25
- International Announcement: WO2021/120664A 2021.06.24
- Date entered country: 2022-08-08
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F16/16 ; G06F16/13

Abstract:
An abnormal index node (inode) dynamic repair method, system, and apparatus, and a readable memory medium. The method includes: obtaining an overall memory structure of an abnormal inode in a memory, and converting the overall memory structure into an editable file; determining an abnormal field in the editable file according to error reporting information; writing an expected value of a file system to a position of the abnormal field in the editable file to obtain a repaired editable file; and importing the repaired editable file back to the memory.
Public/Granted literature
- US20230032428A1 ABNORMAL INODE DYNAMIC REPAIR METHOD AND SYSTEM, AND RELATED COMPONENT Public/Granted day:2023-02-02
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