Invention Grant
- Patent Title: Measuring data quality of data in a graph database
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Application No.: US17083357Application Date: 2020-10-29
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Publication No.: US11651055B2Publication Date: 2023-05-16
- Inventor: Yannick Saillet , Claudio Andrea Fanconi , Martin Oberhofer , Hemanth Kumar Babu , Basem Elasioty , Mike W. Grasselt , Robert Kern , Thuany Karoline Stuart
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Nicholas A. Welling
- Main IPC: G06F18/2413
- IPC: G06F18/2413 ; G06F18/22 ; G06F18/24 ; G06N5/025

Abstract:
Methods, computer program products and/or systems are provided that perform the following operations: obtaining a first graph comprising first nodes representing first entities and first edges representing relationships between first entities, the first nodes being associated with first entity attributes descriptive of the first entities represented by the first nodes, the first edges being associated with first edge attributes descriptive of the relationships represented by the first edges; determining a first subgraph for a certain node of the first nodes of the first graph, the first subgraph including the certain node and at least one neighboring node of the certain node; and determining a data quality issue regarding the certain node based, at least in part, on applying one or more applicable rules of a set of data quality rules to first entity attribute values and first edge attribute values of the first subgraph.
Public/Granted literature
- US20220138512A1 MEASURING DATA QUALITY OF DATA IN A GRAPH DATABASE Public/Granted day:2022-05-05
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