Invention Grant
- Patent Title: Glitch source identification and ranking
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Application No.: US17335976Application Date: 2021-06-01
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Publication No.: US11651131B2Publication Date: 2023-05-16
- Inventor: Vaibhav Jain , Solaiman Rahim , Myunghoon Yoon , Qing Su
- Applicant: Synopsys, Inc.
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Patterson + Sheridan, LLP
- Main IPC: G06F30/3312
- IPC: G06F30/3312 ; G06F119/06 ; G06F119/12

Abstract:
Glitch source identification and ranking is provided by: identifying a plurality of glitch sources in a circuit layout; back referencing the plurality of glitch sources to corresponding lines in a Resistor Transistor Logic (RTL) file defining the plurality of glitch sources; identifying, in the circuit layout, a plurality of glitch terminuses associated with the plurality of glitch sources; determining a plurality of glitch power consumption values associated with the plurality of glitch sources based on fanouts in the circuit layout extending from the plurality of glitch sources to the plurality of glitch terminuses; ranking, by a processor, the plurality of glitch sources based on corresponding glitch power consumption values of the plurality of glitch power consumption values corresponding to individual glitch sources of the plurality of glitch sources; and reporting the corresponding lines in the RTL file associated with the ranked plurality of glitch sources.
Public/Granted literature
- US20210406438A1 GLITCH SOURCE IDENTIFICATION AND RANKING Public/Granted day:2021-12-30
Information query