Invention Grant
- Patent Title: Trench field effect transistor structure free from contact hole
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Application No.: US17600113Application Date: 2019-12-31
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Publication No.: US11652170B2Publication Date: 2023-05-16
- Inventor: Qian Chen
- Applicant: CHINA RESOURCES MICROELECTRONICS (CHONGQING) CO., LTD
- Applicant Address: CN ChongQing
- Assignee: CHINA RESOURCES MICROELECTRONICS (CHONGQING) CO., LTD.
- Current Assignee: CHINA RESOURCES MICROELECTRONICS (CHONGQING) CO., LTD.
- Current Assignee Address: CN ChongQing
- Priority: CN 1911283322.0 2019.12.13
- International Application: PCT/CN2019/130508 2019.12.31
- International Announcement: WO2021/114437A 2021.06.17
- Date entered country: 2021-09-30
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/266 ; H01L29/40 ; H01L29/423 ; H01L29/66

Abstract:
The present disclosure provides a trench field effect transistor and a manufacturing method. The manufacturing method includes: providing a semiconductor substrate, forming an epitaxial layer, a first trench, a second trench, a first gate dielectric layer, a first gate structure, a second gate dielectric layer, a second gate structure, and a body region, forming a source implantation mask, performing ion implantation based on the source implantation mask to form a source, and forming a source electrode structure. Self-aligned source implantation is implemented by designing a source implantation mask, and a body region lead-out region is formed while forming a source, so that the source and the body region are directly led out. The present disclosure uses a self-alignment technique to further reduce a cell dimension, and enables equal-potential electrical lead-out of the source and the body region without providing a source contact hole.
Public/Granted literature
- US20220302308A1 TRENCH FIELD EFFECT TRANSISTOR STRUCTURE AND MANUFACTURING METHOD FOR SAME Public/Granted day:2022-09-22
Information query
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