Invention Grant
- Patent Title: Gate all around semiconductor structure with diffusion break
-
Application No.: US17680199Application Date: 2022-02-24
-
Publication No.: US11653507B2Publication Date: 2023-05-16
- Inventor: Marcus Johannes Henricus Van Dal , Timothy Vasen , Gerben Doornbos
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Seed IP Law Group LLP
- Main IPC: H01L51/05
- IPC: H01L51/05 ; H01L51/00 ; H01L27/28

Abstract:
The current disclosure describes techniques for forming semiconductor structures having multiple semiconductor strips configured as channel portions. In the semiconductor structures, diffusion break structures are formed after the gate structures are formed so that the structural integrity of the semiconductor strips adjacent to the diffusion break structures will not be compromised by a subsequent gate formation process. The diffusion break extends downward from an upper surface until all the semiconductor strips of the adjacent channel portions are truncated by the diffusion break.
Public/Granted literature
- US20220181565A1 GATE ALL AROUND SEMICONDUCTOR STRUCTURE WITH DIFFUSION BREAK Public/Granted day:2022-06-09
Information query
IPC分类: