Invention Grant
- Patent Title: X-ray inspection device, management server for X-ray inspection device, and management method for X-ray inspection device
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Application No.: US17400342Application Date: 2021-08-12
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Publication No.: US11656189B2Publication Date: 2023-05-23
- Inventor: Futoshi Ueki , Bunta Matsuhana
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Maier & Maier, PLLC
- Priority: JP 2020192075 2020.11.18
- Main IPC: G01N23/046
- IPC: G01N23/046 ; G01N23/083

Abstract:
An X-ray inspection device includes a casing including an entrance of an object to be inspected, and a door for opening and closing the entrance; an X-ray detector accommodated inside the casing, and configured to detect a stage on which the object is placed, an X-ray source configured to emit an X-ray, and the X-ray that has been emitted from the X-ray source and transmitted through the object placed on the stage; and a driving system including a moving mechanism of the stage; a communication unit connectable with a communication network; a data acquisition unit configured to acquire consumption determination data including at least one of data indicating an operating situation of the driving system or data indicating the number of times of opening and closing the door; and a data transmission unit configured to output the consumption determination data that has been acquired by the data acquisition unit to the communication network via the communication unit.
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Information query