Invention Grant
- Patent Title: Apparatus and method of testing electronic components
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Application No.: US16408328Application Date: 2019-05-09
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Publication No.: US11656270B2Publication Date: 2023-05-23
- Inventor: Chun-Hung Sun , Yi-Ting Liu
- Applicant: ASE TEST, INC.
- Applicant Address: TW Kaohsiung
- Assignee: ASE TEST, INC.
- Current Assignee: ASE TEST, INC.
- Current Assignee Address: TW Kaohsiung
- Agency: Foley & Lardner LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G06T11/20

Abstract:
An apparatus is provided that includes a control unit and a memory including computer program code. The apparatus is capable of applying a first signal having a first value and a second signal having a second value to an electronic component and receiving a first feedback signal. The apparatus is capable of determining a first parameter associated with the first feedback signal. The apparatus is capable of applying a third signal having a third value and the second signal to the electronic component and receiving a second feedback signal. The apparatus is capable of determining a second parameter associated with the second feedback signal. The apparatus is capable of applying a fourth signal having a fourth value and the second signal to the electronic component if the first parameter is different from the second parameter.
Information query