Apparatus and method of testing electronic components
Abstract:
An apparatus is provided that includes a control unit and a memory including computer program code. The apparatus is capable of applying a first signal having a first value and a second signal having a second value to an electronic component and receiving a first feedback signal. The apparatus is capable of determining a first parameter associated with the first feedback signal. The apparatus is capable of applying a third signal having a third value and the second signal to the electronic component and receiving a second feedback signal. The apparatus is capable of determining a second parameter associated with the second feedback signal. The apparatus is capable of applying a fourth signal having a fourth value and the second signal to the electronic component if the first parameter is different from the second parameter.
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