Invention Grant
- Patent Title: Analysis device, analysis method, and recording medium
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Application No.: US17270449Application Date: 2020-02-20
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Publication No.: US11656592B2Publication Date: 2023-05-23
- Inventor: Yuya Ota , Reiko Hattori , Kosuke Tsuruta , Akira Nakajima , Shinsuke Kawanoue
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JP 2019045744 2019.03.13
- International Application: PCT/JP2020/006719 2020.02.20
- International Announcement: WO2020/184129A 2020.09.17
- Date entered country: 2021-02-23
- Main IPC: G05B19/042
- IPC: G05B19/042

Abstract:
An analysis device according to one aspect of the present invention supplies a definition for a dependency relation between an input parameter and an output parameter of a standard function, which cannot be derived in a dependency analysis of a control program, the definition being supplied by use of function structure information which is external information. In other words, an analysis device according to this configuration identifies a dependency relation between an input parameter and an output parameter of the standard function on the basis of function structure information that defines a dependency relation between the input parameter and the output parameter of the standard function. Therefore, the dependency relation between the input and the output of a standard function becomes clear, so the dependency relations between a plurality of device variables that mediate the standard function can be identified.
Public/Granted literature
- US20210397148A1 ANALYSIS DEVICE, ANALYSIS METHOD, AND RECORDING MEDIUM Public/Granted day:2021-12-23
Information query
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