Invention Grant
- Patent Title: Semiconductor device and method of manufacturing
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Application No.: US16945224Application Date: 2020-07-31
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Publication No.: US11658245B2Publication Date: 2023-05-23
- Inventor: Shyh-Shin Ferng
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L27/11 ; H01L29/66 ; H01L27/146 ; H01L29/06 ; H01L29/417 ; H01L29/423 ; H01L29/45 ; H01L21/02 ; H01L21/306 ; H01L21/285

Abstract:
Gate-all-around (GAA) devices and methods of manufacturing such devices are described herein. A method includes forming a multi-layer structure over a substrate and forming a plurality of source/drain regions in the multi-layer structure. Fins are then patterned into the multi-layer structure through adjacent source/drain regions. A wire release process is performed to remove materials of one or more of the layers in the multi-layer stack. The remaining layers of the multi-layer stack form a stack of nanostructures connecting adjacent source/drain regions of the fins.
Public/Granted literature
- US20210126134A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING Public/Granted day:2021-04-29
Information query
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