Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US17134193Application Date: 2020-12-25
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Publication No.: US11665888B2Publication Date: 2023-05-30
- Inventor: Wei-Lun Hsu , Hung-Lin Shih , Che-Hung Huang , Ping-Cheng Hsu , Hsu-Yang Wang
- Applicant: UNITED MICROELECTRONICS CORP. , Fujian Jinhua Integrated Circuit Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.,Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee: UNITED MICROELECTRONICS CORP.,Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee Address: TW Hsin-Chu; CN Quanzhou
- Agent Winston Hsu
- Priority: CN 1810189345.4 2018.03.08
- The original application number of the division: US15943721 2018.04.03
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/768 ; H01L21/762 ; H01L21/8234 ; H01L21/8238

Abstract:
A method for fabricating semiconductor device includes the steps of: forming a semiconductor layer on a substrate; removing part of the semiconductor layer and part of the substrate to form a trench; forming a liner in the trench; removing part of the liner to form a spacer adjacent to two sides of the trench; forming a conductive layer in the trench; forming a metal layer on the conductive layer; forming a mask layer on the metal layer; and patterning the mask layer, the metal layer, and the conductive layer to form a bit line structure.
Public/Granted literature
- US20210118889A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2021-04-22
Information query
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