Invention Grant
- Patent Title: Method of phase contrast imaging
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Application No.: US17863676Application Date: 2022-07-13
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Publication No.: US11666295B2Publication Date: 2023-06-06
- Inventor: Peiyan Cao , Yurun Liu
- Applicant: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: IPro, PLLC
- Agent Qian Gu
- Main IPC: A61N5/10
- IPC: A61N5/10 ; A61B6/00

Abstract:
Disclosed herein is a method, comprising: for i=1, . . . , M, sending a pencil radiation beam (i) toward an image sensor, wherein the pencil radiation beam (i) is incident on an incident region (i) on the image sensor, wherein the pencil radiation beam (i) is aimed at a target region (i) on the image sensor, wherein M is a positive integer, wherein the image sensor comprises active areas spatially discontinuous from each other, and wherein the incident regions (i), i=1, . . . , M and the target regions (i), i=1, . . . , M are on the active areas; and for i=1, . . . , M, determining an offset (i) between the incident region (i) and the target region (i).
Public/Granted literature
- US20220346737A1 METHOD OF PHASE CONTRAST IMAGING Public/Granted day:2022-11-03
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