Invention Grant
- Patent Title: Angle-of-view testing method, device and system for a projection display device
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Application No.: US17045678Application Date: 2019-01-21
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Publication No.: US11667197B2Publication Date: 2023-06-06
- Inventor: Wei Wei , Xiangxiang Zou , Saihua Chen
- Applicant: BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Myers Bigel, P.A.
- Priority: CN 1810321080.9 2018.04.11
- International Application: PCT/CN2019/072527 2019.01.21
- International Announcement: WO2019/196536A 2019.10.17
- Date entered country: 2020-10-06
- Main IPC: B60K35/00
- IPC: B60K35/00 ; G02B27/14 ; H04N9/31

Abstract:
An angle-of-view testing method for a projection display device, including setting a reference viewpoint at a same side as a reflective surface associated with the projection display device, setting a metrical marker plate with a metrical marker at another side opposite to the reflective surface at a first distance from the reference viewpoint, projecting a testing picture onto the reflective surface by the projection display device, where light of the testing picture is reflected by the reflective surface toward the reference viewpoint, such that a projected image as a virtual image of the testing picture is observed at the reference viewpoint as being projected onto the metrical marker plate, determining the coverage of the projected image with respect to the metrical marker of the metrical marker plate, and determining an angle of view of the projection display device based on the determined coverage.
Public/Granted literature
- US20210029334A1 ANGLE-OF-VIEW TESTING METHOD, DEVICE AND SYSTEM FOR A PROJECTION DISPLAY DEVICE Public/Granted day:2021-01-28
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