- Patent Title: Methods and compositions for rapid and high throughput diagnosis
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Application No.: US17478415Application Date: 2021-09-17
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Publication No.: US11667962B2Publication Date: 2023-06-06
- Inventor: Jef D. Boeke , Jon Laurent , Andrew Martin , Paolo Mita
- Applicant: Opentrons Labworks Inc. , New York University
- Applicant Address: US NY Brooklyn
- Assignee: Opentrons Labworks Inc.,New York University
- Current Assignee: Opentrons Labworks Inc.,New York University
- Current Assignee Address: US NY Brooklyn; US NY New York
- Agency: Wilson Sonsini Goodrich & Rosati
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12Q1/6848 ; C12Q1/70
Abstract:
Provided herein are methods and compositions for diagnosing a disease or an infection in a high throughput manner. Also provided herein are methods and compositions for diagnosing a disease or an infection with high specificity and high sensitivity.
Public/Granted literature
- US20220090186A1 METHODS AND COMPOSITIONS FOR RAPID AND HIGH THROUGHPUT DIAGNOSIS Public/Granted day:2022-03-24
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