A contact measurement system for measuring a parameter of a contact of a switchgear includes: a first device for measuring an electrical resistance of the contact and mapping the electrical resistance spatially and/or dynamically; a second device for measuring an axial force of the contact and to map the axial force spatially and/or dynamically as a measured axial force; and a third device for measuring a position of the contact. The contact measurement system determines a position-depending force characteristic based on the measured axial force of the contact and the position of the contact. The contact measurement system determines a status of the contact based on a combination of the position-depending force characteristic with the electrical resistance of the contact.