Invention Grant
- Patent Title: System and method for detecting imperfections in a screen
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Application No.: US17808516Application Date: 2022-06-23
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Publication No.: US11669206B2Publication Date: 2023-06-06
- Inventor: Amit Gross , Oded Rozenberg , Moshe Lipsker
- Applicant: ESW HOLDINGS, INC.
- Applicant Address: US TX Austin
- Assignee: ESW Holdings, Inc.
- Current Assignee: ESW Holdings, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G01N29/12 ; G01N29/46 ; G01N29/14 ; G06F3/04883

Abstract:
A method and system for detecting imperfections on a surface of a touchscreen of an electrical device, comprising: swiping a test object, such as a fingertip, a fingernail or a pin, along at least a portion of the touchscreen; producing, by the touchscreen, an electric signal indicative of the test object's contact with the touchscreen; receiving an acoustic signal by an acoustic sensor, during the swipe of the test object along the touchscreen; analyzing, by a processor, at least one of the electric signal and received acoustic signal; and determining existence of imperfections on the touchscreen's surface based on the analysis.
Public/Granted literature
- US20220350439A1 System and Method for Detecting Imperfections in a Screen Public/Granted day:2022-11-03
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