• Patent Title: Learning system, analysis system, learning method, and storage medium
  • Application No.: US16629093
    Application Date: 2017-07-13
  • Publication No.: US11669771B2
    Publication Date: 2023-06-06
  • Inventor: Masanao Natsumeda
  • Applicant: NEC CORPORATION
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • International Application: PCT/JP2017/025559 2017.07.13
  • International Announcement: WO2019/012653A 2019.01.17
  • Date entered country: 2020-01-07
  • Main IPC: G06N20/00
  • IPC: G06N20/00 G06F16/28
Learning system, analysis system, learning method, and storage medium
Abstract:
A learning system including: a training data acquisition unit that, for each of a plurality of feature amounts obtained by converting time-series data on a predetermined period basis, acquires training data with which an event type in the predetermined period is associated; and a classifier learning unit that performs learning on a plurality of classifiers different from each other by using a feature amount group including one or more feature amounts corresponding to some or all periods out of the plurality of feature amounts included in the training data to perform learning on a classifier, which classifies the event type, for multiple times while changing a combination in the feature amount group, and the event type includes a first event type corresponding to a state where a target event to be classified occurs and a second event type corresponding to a state where the target event does not occur.
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