Invention Grant
- Patent Title: Automated planogram anomaly detection
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Application No.: US16901576Application Date: 2020-06-15
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Publication No.: US11669843B2Publication Date: 2023-06-06
- Inventor: Pranay Dugar , Souradip Chakraborty
- Applicant: Walmart Apollo, LLC
- Applicant Address: US AR Bentonville
- Assignee: Walmart Apollo, LLC
- Current Assignee: Walmart Apollo, LLC
- Current Assignee Address: US AR Bentonville
- Agency: Barta, Jones & Foley, PLLC
- Priority: IN 1941028192 2019.07.13
- Main IPC: G06Q10/00
- IPC: G06Q10/00 ; G06Q30/018 ; G06Q10/087 ; G06Q10/10 ; G06T7/00 ; G06T7/13 ; G06N3/044 ; G06V10/75 ; G06V10/82

Abstract:
An automated planogram anomaly detection solution rapidly and reliably identifies mismatches between planograms and actual item placement. Examples receive a real time (RT) image of a shelf unit corresponding to at least a first portion of a planogram; detect, within the RT image, item boundaries for a plurality of items on the shelf unit and tag boundaries for a plurality of tags associated with the shelf unit; extract text from at least one tag; extract attributes from at least one item; map the extracted item attributes with the extracted tag text; detect, based at least on the map, a planogram anomaly; and based at least on detecting the planogram anomaly, generate a report identifying the planogram anomaly (e.g., a mismatch between a tag and an item). Some examples compare the RT image with a ground truth (GT) image to detect anomalies, for example empty space on the shelf unit.
Public/Granted literature
- US20210012272A1 AUTOMATED PLANOGRAM ANOMALY DETECTION Public/Granted day:2021-01-14
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