Invention Grant
- Patent Title: Object area measurement method, electronic device and storage medium
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Application No.: US17412574Application Date: 2021-08-26
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Publication No.: US11669990B2Publication Date: 2023-06-06
- Inventor: Yan Peng , Xiang Long , Shumin Han , Honghui Zheng , Zhuang Jia , Xiaodi Wang , Pengcheng Yuan , Yuan Feng , Bin Zhang , Ying Xin
- Applicant: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing
- Assignee: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
- Current Assignee: BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: CN 2110081896.0 2021.01.21
- Main IPC: G06T7/62
- IPC: G06T7/62 ; G06F18/241 ; G06F18/25 ; G06F18/2137 ; G06V10/764 ; G06V10/80 ; G06V10/82 ; G06V10/32 ; G06V10/50 ; G06V10/26 ; G06V20/13

Abstract:
An object area measurement method and an apparatus are provided, relating to the computer vision and deep learning technology. The method includes acquiring an original image with a spatial resolution, the original image including a target object; acquiring an object identification model including at least two sets of classification models; generating one or more original image blocks based on the original image; performing operations on each original image block: scaling each original image block at at least two scaling levels to obtain scaled image blocks with at least two sizes, the scaled image blocks respectively corresponding to the at least two sets of classification models, and inputting the scaled image blocks into the object identification model to obtain an identification result of the target object; and determining an area of the target object based on the respective identification results of the one or more original image blocks and the spatial resolution.
Public/Granted literature
- US20210390728A1 OBJECT AREA MEASUREMENT METHOD, ELECTRONIC DEVICE AND STORAGE MEDIUM Public/Granted day:2021-12-16
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