A re-programmable integrated circuit (IC) includes a plurality of non-volatile memory elements, each including a fuse portion initially configured to have either a first resistance value or a second resistance value. Re-programming circuitry includes a controllable element coupled to each fuse portion and selectively operable to cause an electrical current to flow through the fuse portion sufficient to cause that fuse portion to transition to an altered state having a resistance value greater than the first and second resistance values. Reference resistance circuitry is configurable between an initial state and a re-programmed state. Read circuitry determines the logic state of each of the memory elements using a comparator circuit operable to sense the resistance value of a fuse portion and the reference resistance, whether in the initial or re-programmed state, wherein the logic state of a memory element is a function of whether the resistance value of the fuse portion is greater than or less than the reference resistance.