- Patent Title: Component evaluation method, electrical characteristic measurement method, component packaging machine, and machine dedicated to electrical characteristic measurement
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Application No.: US16334518Application Date: 2016-09-20
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Publication No.: US11672109B2Publication Date: 2023-06-06
- Inventor: Mitsuhiko Shibata
- Applicant: FUJI CORPORATION
- Applicant Address: JP Chiryu
- Assignee: FUJI CORPORATION
- Current Assignee: FUJI CORPORATION
- Current Assignee Address: JP Chiryu
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- International Application: PCT/JP2016/077625 2016.09.20
- International Announcement: WO2018/055658A 2018.03.29
- Date entered country: 2019-03-19
- Main IPC: H05K13/08
- IPC: H05K13/08 ; H05K13/04 ; H05K13/00
Abstract:
Based on the measured values of the electrical characteristics of multiple components including a component positioned in the middle among many components held on the component tape, it is possible to more accurately estimate the electrical characteristics of the many components as compared with the case based on the measured value of the electrical characteristic of a component positioned at the leading end. Also, based on the statistically processed results of these measurement values, it is possible to appropriately evaluate the electrical characteristics of many components. Further, if the electrical characteristics of all of the components are measured, the evaluation can be performed more appropriately.
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