Invention Grant
- Patent Title: X-ray imaging apparatus and method of X-ray image analysis
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Application No.: US15874389Application Date: 2018-01-18
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Publication No.: US11672499B2Publication Date: 2023-06-13
- Inventor: Fumiaki Tanaka
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Nolte Lackenbach Siegel
- Agent Andrew F. Young, Esq.
- Priority: JP 2017016043 2017.01.31
- Main IPC: A61B6/00
- IPC: A61B6/00 ; A61B5/00

Abstract:
An X-ray imaging apparatus includes an X-ray irradiation element, an X-ray detection element, an X-ray image generation element, and an image processing analysis element. The image processing analysis element reflects the analysis point on each frame based on a respective relative location between a characteristic point 10 of the X-ray image consisting of a plurality of frames. In addition, an image analysis element analyzes the time-course variation of the blood flow in the blood vessel of the heart based on the variation of the pixel value at the analysis point of each frame of the X-ray image.
Public/Granted literature
- US20180214109A1 X-RAY IMAGING APPARATUS AND METHOD OF X-RAY IMAGE ANALYSIS Public/Granted day:2018-08-02
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