Invention Grant
- Patent Title: Optical measurement device
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Application No.: US16523646Application Date: 2019-07-26
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Publication No.: US11674794B2Publication Date: 2023-06-13
- Inventor: Hisayasu Morino , Kenichi Matoba , Takahiro Suga
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: JP 16060274 2016.03.24
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01C3/06 ; G01B11/06 ; G01B11/14 ; G01N21/27

Abstract:
A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
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