Invention Grant
- Patent Title: System for detecting data drift in machine-learning process monitoring
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Application No.: US17944750Application Date: 2022-09-14
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Publication No.: US11676055B2Publication Date: 2023-06-13
- Inventor: Francisco P. Maturana , Gregory J. Vance , Mikica Cvijetinovic , Braun C. Brennecke
- Applicant: Rockwell Automation Technologies, Inc.
- Applicant Address: US OH Mayfield Heights
- Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee: Rockwell Automation Technologies, Inc.
- Current Assignee Address: US OH Mayfield Heights
- Agency: Boyle Fredrickson, SC
- Main IPC: G06N7/01
- IPC: G06N7/01 ; G06T7/00 ; G06N20/00

Abstract:
A monitor provides run time monitoring of the input values to a signature analyzer having a machine-learning engine to compare statistics measuring the domain of those input values to the domain of input values used in the training set of the machine-learning engine. This comparison yields an indication of whether retraining of the machine-learning engine is required without analysis of the output of the machine-learning engine algorithm or the need for errors to become manifest.
Public/Granted literature
- US20230020485A1 System For Detecting Data Drift In Machine-Learning Process Monitoring Public/Granted day:2023-01-19
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