Invention Grant
- Patent Title: Semiconductor device
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Application No.: US17211538Application Date: 2021-03-24
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Publication No.: US11676789B2Publication Date: 2023-06-13
- Inventor: Yoshiomi Shiina , Kenji Yoshida
- Applicant: ABLIC Inc.
- Applicant Address: JP Tokyo
- Assignee: ABLIC Inc.
- Current Assignee: ABLIC Inc.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP 2020061155 2020.03.30
- Main IPC: H01H85/02
- IPC: H01H85/02 ; H03K3/037 ; G01R31/74 ; H03K19/20

Abstract:
Provided is a semiconductor device capable of detecting an abnormal state in which two fuses are both short-circuited or cut. The semiconductor device includes: a trimming circuit having a first fuse and a second fuse connected in series; a current source circuit configured to supply current to the trimming circuit; and a determination circuit configured to determine whether a connection state or disconnect state of the first fuse and the second fuse are abnormal or not based upon signals derived from an output signal of the trimming circuit.
Public/Granted literature
- US20210304997A1 SEMICONDUCTOR DEVICE Public/Granted day:2021-09-30
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