Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US17012851Application Date: 2020-09-04
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Publication No.: US11676820B2Publication Date: 2023-06-13
- Inventor: Oh-Hyun Kim , Sung-Hwan Ahn , Hae-Jung Park , Tae-Hang Ahn
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR 20170068636 2017.06.01
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H10B12/00 ; H01L21/768 ; H01L27/108

Abstract:
A method for fabricating a semiconductor device includes: preparing a substrate; forming an isolation layer defining an active region in the substrate; forming a first insulation structure over the substrate, the first insulation structure defining a line-type opening that exposes the isolation layer and the active region; forming a plug pad through a Selective Epitaxial Growth (SEG) process over the exposed active regions; forming a second insulation structure inside the line-type opening, the second insulation structure defining a contact hole landing on the plug pad; and filling the contact hole with a contact plug.
Information query
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