Invention Grant
- Patent Title: Manufacturing method of semiconductor device and semiconductor device
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Application No.: US17827777Application Date: 2022-05-29
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Publication No.: US11676994B2Publication Date: 2023-06-13
- Inventor: Janbo Zhang , Li-Wei Feng , Yu-Cheng Tung
- Applicant: Fujian Jinhua Integrated Circuit Co., Ltd.
- Applicant Address: CN Quanzhou
- Assignee: Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee: Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee Address: CN Quanzhou
- Agent Winston Hsu
- Priority: CN 2010842754.7 2020.08.20
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L27/06 ; H01L29/06 ; H10B12/00 ; H01L49/02

Abstract:
The present invention provides a manufacturing method of a semiconductor device and a semiconductor device. A semiconductor device is provided, the semiconductor device includes a substrate, a stacked structure disposed on the substrate, the substrate comprises a cell array region, a peripheral circuit region and a middle region between the cell array region and the peripheral circuit region, the stacked structure comprises a first support layer, a first trench located in the middle region, a second support layer located on an upper surface of the stacked structure, wherein parts of the second support layer is disposed in the first trench, a portion of a sidewall of the first support layer directly contacts a portion of a sidewall of the second support layer, and a capacitor structure located in the cell array region.
Public/Granted literature
- US20220293721A1 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2022-09-15
Information query
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