Invention Grant
- Patent Title: Method of manufacturing magnetic tunnel junction and magnetic tunnel junction
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Application No.: US17590122Application Date: 2022-02-01
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Publication No.: US11678583B2Publication Date: 2023-06-13
- Inventor: Yu Zhao , Katsuya Miura , Hirotaka Hamamura , Masaki Yamada , Kiyohiko Sato
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge, P.C.
- Priority: JP 2018116619 2018.06.20
- The original application number of the division: US16489838
- Main IPC: H01L21/3065
- IPC: H01L21/3065 ; H01L43/12 ; H01L27/22 ; H01L43/02 ; H01L43/10

Abstract:
Provided is a method of manufacturing a magnetic tunnel junction that simultaneously realizes removal of oxides on side walls of a magnetic layer and formation of a protective film and prevents deterioration of magnetic characteristics. The method includes: a first step 802 of etching a stacked film including a first magnetic layer, a MgO barrier layer, and a second magnetic layer stacked in order by plasma etching using an oxidizing gas to form the magnetic tunnel junction; and a second step 803 of simultaneously introducing an organic acid gas which is an n-valent acid and a precursor gas having a corresponding metal element valence of m, to form a first protective film on side walls of the magnetic tunnel junction. In the second step, the precursor gas is introduced at a molar ratio of n/m or more with respect to 1 mole of the organic acid gas introduced.
Public/Granted literature
- US20220158088A1 METHOD OF MANUFACTURING MAGNETIC TUNNEL JUNCTION AND MAGNETIC TUNNEL JUNCTION Public/Granted day:2022-05-19
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