Invention Grant
- Patent Title: Measuring method
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Application No.: US17542504Application Date: 2021-12-06
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Publication No.: US11682179B2Publication Date: 2023-06-20
- Inventor: Yu-Tai Li , Kao-Chi Lin , Cho-Fan Hsieh , Teng-Chun Wu , Cheng-Yu Peng
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: JCIPRNET
- Priority: TW 0138960 2021.10.20
- Main IPC: G06T19/00
- IPC: G06T19/00 ; G06T3/40

Abstract:
A measuring method includes the following. An image to be tested of an object to be tested with a first characteristic pattern is formed and is copied to form multiple images to be tested. The multiple images to be tested are superimposed to form a to-be-tested overlapped image which has the multiple first characteristic patterns. A reference image of a reference object with a second characteristic pattern is formed and is copied to form multiple reference images. The multiple reference images are superimposed to form a reference overlapped image which has the multiple second characteristic patterns. The to-be-tested overlapped image and the reference overlapped image are superimposed to generate a virtual moiré image having a moiré pattern different from the multiple first characteristic patterns and the multiple second characteristic patterns.
Public/Granted literature
- US20230119864A1 MEASURING METHOD Public/Granted day:2023-04-20
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