Invention Grant
- Patent Title: Method of RRAM write ramping voltage in intervals
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Application No.: US17536386Application Date: 2021-11-29
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Publication No.: US11682457B2Publication Date: 2023-06-20
- Inventor: Brent Haukness , Zhichao Lu
- Applicant: Hefei Reliance Memory Limited
- Applicant Address: CN Hefei
- Assignee: Hefei Reliance Memory Limited
- Current Assignee: Hefei Reliance Memory Limited
- Current Assignee Address: CN Hefei
- Agency: Sheppard Mullin Richter & Hampton LLP
- The original application number of the division: US16984043 2020.08.03
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
A resistive random access memory (RRAM) circuit and related method limits current, or ramp voltage, applied to a source line or bitline of an RRAM array. The RRAM array has one or more source lines and one or more bitlines. A control circuit sets an RRAM cell to a low resistance state in a set operation, and resets the RRAM cell to a high resistance state in a reset operation. A voltage applied to a bitline or source line is ramped during a first time interval, held to a maximum voltage value during a second interval, and ceased after the second time interval.
Public/Granted literature
- US20220084593A1 METHOD OF RRAM WRITE RAMPING VOLTAGE IN INTERVALS Public/Granted day:2022-03-17
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