Invention Grant
- Patent Title: Wavelength checker
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Application No.: US17285209Application Date: 2019-11-08
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Publication No.: US11693179B2Publication Date: 2023-07-04
- Inventor: Takuya Tanaka , Hiroshi Ishikawa , Kota Shikama
- Applicant: Nippon Telegraph and Telephone Corporation
- Applicant Address: JP Tokyo
- Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee: Nippon Telegraph and Telephone Corporation
- Current Assignee Address: JP Tokyo
- Agency: Slater Matsil, LLP
- Priority: JP 18219011 2018.11.22
- International Application: PCT/JP2019/043838 2019.11.08
- International Announcement: WO2020/105472A 2020.05.28
- Date entered country: 2021-04-14
- Main IPC: G02B6/12
- IPC: G02B6/12 ; G02B6/42

Abstract:
A wavelength checker includes an optical waveguide chip. A known arrayed-waveguide diffraction grating is formed on the optical waveguide chip. The wavelength checker includes a light conversion unit made of a conversion material that converts infrared light into visible light. The light conversion unit is arranged on an output side of a plurality of first output waveguides of the optical waveguide chip to be capable of receiving light emitted from the plurality of first output waveguides. The light conversion unit is formed on a side surface of a support facing an output end surface of the optical waveguide chip. The support is fixed to a main board.
Public/Granted literature
- US20210373233A1 Wavelength Checker Public/Granted day:2021-12-02
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