Invention Grant
- Patent Title: Garbage collection adapted to memory device life expectancy
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Application No.: US17527776Application Date: 2021-11-16
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Publication No.: US11693769B2Publication Date: 2023-07-04
- Inventor: Qing Liang , Deping He , David Aaron Palmer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F12/02 ; G11C11/16 ; G11C16/10 ; G11C16/34 ; G11C16/04

Abstract:
Systems and methods for adapting garbage collection (GC) operations in a memory device to an estimated device age are discussed. An exemplary memory device includes a memory controller to track an actual device age, determine a device wear metric using a physical write count and total writes over an expected lifetime of the memory device, estimate a wear-indicated device age, and adjust an amount of memory space to be freed by a GC operation according to the wear-indicated device age relative to the actual device age. The memory controller can also dynamically reallocate a portion of the memory cells between a single level cell (SLC) cache and a multi-level cell (MLC) storage according to the wear-indicated device age relative to the actual device age.
Public/Granted literature
- US20220075722A1 GARBAGE COLLECTION ADAPTED TO MEMORY DEVICE LIFE EXPECTANCY Public/Granted day:2022-03-10
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