Invention Grant
- Patent Title: Uncorrectable ECC
-
Application No.: US17382926Application Date: 2021-07-22
-
Publication No.: US11694760B2Publication Date: 2023-07-04
- Inventor: Jianmin Huang , Deping He , Xiangang Luo , Harish Reddy Singidi , Kulachet Tanpairoj , John Zhang , Ting Luo
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C29/42
- IPC: G11C29/42 ; G11C29/14 ; G11C29/20 ; G11C29/44 ; G11C29/00

Abstract:
Disclosed in some examples are NAND devices, firmware, systems, methods, and devices that apply smart algorithms to process ECC errors by taking advantage of excess overprovisioning. In some examples, when the amount of overprovisioned blocks are above a predetermined threshold, a first ECC block error handling mode may be implemented and when the overprovisioned blocks are equal or less than the predetermined threshold, a second mode of ECC block error handling may be utilized.
Public/Granted literature
- US20210350871A1 UNCORRECTABLE ECC Public/Granted day:2021-11-11
Information query