Invention Grant
- Patent Title: Silicon nitride x-ray window and method of manufacture for x-ray detector use
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Application No.: US17411197Application Date: 2021-08-25
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Publication No.: US11694867B2Publication Date: 2023-07-04
- Inventor: Joseph S. Fragala , Xing Zhao
- Applicant: Bruker Nano, Inc.
- Applicant Address: US CA Santa Barbara
- Assignee: Bruker Nano, Inc.
- Current Assignee: Bruker Nano, Inc.
- Current Assignee Address: US CA Santa Barbara
- Agency: Boyle Fredrickson S.C.
- Main IPC: H01J5/18
- IPC: H01J5/18 ; H01J9/24 ; H01J9/233 ; H01J35/18

Abstract:
A method for producing a radiation window includes patterning a photo resist structure onto a double-sided silicon wafer, plasma etching the silicon wafer to create an etched silicon wafer having a silicon supporting structure etched upon a first side of the double-sided silicon wafer, applying a silicon nitride thin film to the etched silicon wafer, patterning a photo resist structure and plasma etching a second side of the double-sided silicon wafer to create an initial window in the silicon nitride thin film, and wet etching the second side of the double-sided silicon wafer to release the silicon nitride thin film and supporting structure from the portion of the double-sided silicon wafer defined by the initial window.
Public/Granted literature
- US20220068635A1 Silicon Nitride X-Ray Window and Method of Manufacture for X-Ray Detector Use Public/Granted day:2022-03-03
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