Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US17226963Application Date: 2021-04-09
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Publication No.: US11694955B2Publication Date: 2023-07-04
- Inventor: Zhi-Sheng Zheng , Chih-Lin Wang
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/532 ; H01L23/528

Abstract:
A device comprises a first dielectric layer, a first conductor, a carbon-containing etch stop layer, a second dielectric layer, and a second conductor. The first conductor has a lower portion in the first dielectric layer. The carbon-containing etch stop layer wraps an upper portion of the first conductor. The second dielectric layer is over the carbon-containing etch stop layer. An interface formed by the second dielectric layer and the carbon-containing etch stop layer is higher over the first conductor than over the first dielectric layer. The second conductor is in the second dielectric layer.
Public/Granted literature
- US20210225765A1 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Public/Granted day:2021-07-22
Information query
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