Invention Grant
- Patent Title: Atomic layer deposition of selected molecular clusters
-
Application No.: US17948961Application Date: 2022-09-20
-
Publication No.: US11695053B2Publication Date: 2023-07-04
- Inventor: John H. Zhang
- Applicant: STMICROELECTRONICS, INC.
- Applicant Address: US TX Coppell
- Assignee: STMICROELECTRONICS, INC.
- Current Assignee: STMICROELECTRONICS, INC.
- Current Assignee Address: US TX Coppell
- Agency: Seed Intellectual Property Law Group LLP
- The original application number of the division: US14464604 2014.08.20
- Main IPC: H01L29/51
- IPC: H01L29/51 ; H01L21/02 ; H01L21/28 ; H01L29/45 ; H01L29/49 ; H01L21/8234 ; H01L21/8238 ; H01L21/285 ; H01L21/768 ; C23C14/04 ; C23C14/22 ; H01L29/66

Abstract:
Energy bands of a thin film containing molecular clusters are tuned by controlling the size and the charge of the clusters during thin film deposition. Using atomic layer deposition, an ionic cluster film is formed in the gate region of a nanometer-scale transistor to adjust the threshold voltage, and a neutral cluster film is formed in the source and drain regions to adjust contact resistance. A work function semiconductor material such as a silver bromide or a lanthanum oxide is deposited so as to include clusters of different sizes such as dimers, trimers, and tetramers, formed from isolated monomers. A type of Atomic Layer Deposition system is used to deposit on semiconductor wafers molecular clusters to form thin film junctions having selected energy gaps. A beam of ions contains different ionic clusters which are then selected for deposition by passing the beam through a filter in which different apertures select clusters based on size and orientation.
Public/Granted literature
- US20230018529A1 ATOMIC LAYER DEPOSITION OF SELECTED MOLECULAR CLUSTERS Public/Granted day:2023-01-19
Information query
IPC分类: