Invention Grant
- Patent Title: Protective bilayer inner spacer for nanosheet devices
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Application No.: US17346798Application Date: 2021-06-14
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Publication No.: US11695057B2Publication Date: 2023-07-04
- Inventor: Yao Yao , Ruilong Xie , Andrew Greene , Veeraraghavan S. Basker
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Ryan, Mason & Lewis, LLP
- Agent Daniel Yeates
- The original application number of the division: US16518153 2019.07.22
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/306 ; H01L29/08 ; H01L29/40 ; H01L21/311 ; H01L21/308 ; H01L29/10 ; H01L29/06 ; H01L29/78 ; H01L21/02

Abstract:
A method for manufacturing a semiconductor device includes forming a plurality of first semiconductor layers alternately stacked with a plurality of second semiconductor layers on a semiconductor substrate, and laterally recessing the plurality of first semiconductor layers with respect to the plurality of second semiconductor layers to form a plurality of vacant areas on lateral sides of the plurality of first semiconductor layers. In the method, a plurality of first inner spacers are formed on the lateral sides of the plurality of first semiconductor layers in respective ones of the plurality of vacant areas, and a plurality of second inner spacers are formed on sides of the plurality of first inner spacers in the respective ones of the plurality of vacant areas. The method also includes laterally recessing the plurality of second semiconductor layers, and growing a plurality of source/drain regions from the plurality of second semiconductor layers.
Public/Granted literature
- US20210305410A1 PROTECTIVE BILAYER INNER SPACER FOR NANOSHEET DEVICES Public/Granted day:2021-09-30
Information query
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