Systems, methods, techniques and apparatuses of a semiconductor control system are disclosed. One exemplary embodiment is a method for protecting a semiconductor switch comprising receiving a first voltage during a second blanking period following a first blanking period; determining whether a short circuit fault is occurring by comparing the first voltage to a fast detection threshold corresponding to a first value of a drain-source voltage of the semiconductor switch; if a short circuit is not occurring: receiving a second voltage after the second blanking period ends; determining whether a short circuit fault is occurring by comparing the second voltage to a slow detection threshold corresponding to a second value of the drain-source voltage; and if a short circuit fault is occurring, opening the semiconductor switch, wherein the first value of the drain-source voltage is greater than the second value of the drain-source voltage.