Invention Grant
- Patent Title: Method, apparatus, and non-transitory computer readable medium for testing terminals
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Application No.: US17366375Application Date: 2021-07-02
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Publication No.: US11696159B2Publication Date: 2023-07-04
- Inventor: Lei-Tong Yu , Xue-Liang Xu
- Applicant: Fu Tai Hua Industry (Shenzhen) Co., Ltd. , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shenzhen; TW New Taipei
- Agency: ScienBiziP, P.C.
- Priority: CN 2110449745.6 2021.04.25
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04B17/00

Abstract:
A method for testing terminals includes determining a quantity of terminals to be tested; testing each terminal to be tested in a testing environment and obtaining a quantity of testing results; each testing result includes an actual transmitting power and/or a receiving signal strength; obtaining a first fitting function based on the actual transmitting power, and/or obtaining a second fitting function based on the receiving signal strength; and controlling a target terminal to transmit signals, calculating an actual transmitting power of the target terminal by the first fitting function, and/or controlling the target terminal to receive signals, calculating a receiving signal strength of the target terminal by the second fitting function. A computer apparatus and a non-transitory computer readable medium for testing terminals are also disclosed.
Public/Granted literature
- US20220345916A1 METHOD, APPARATUS, AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TESTING TERMINALS Public/Granted day:2022-10-27
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