Invention Grant
- Patent Title: Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer
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Application No.: US17793913Application Date: 2020-12-04
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Publication No.: US11698353B2Publication Date: 2023-07-11
- Inventor: Yoshiyuki Kataoka , Yasushi Kusakabe
- Applicant: Rigaku Corporation
- Applicant Address: JP Akishima
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Hea Law PLLC
- Priority: JP 20021771 2020.02.12
- International Application: PCT/JP2020/045322 2020.12.04
- International Announcement: WO2021/161631A 2021.08.19
- Date entered country: 2022-07-19
- Main IPC: G01N23/223
- IPC: G01N23/223 ; G01N23/2208

Abstract:
Provided are a quantitative analysis method, a quantitative analysis program, and an X-ray fluorescence. The quantitative analysis method includes: a step of acquiring a representative composition set to represent contents of analysis components; a step of acquiring a plurality of comparative compositions, in each of which the content of one of the analysis components of the representative composition is changed by a predetermined content; a detection intensity calculation step of calculating a detection intensity indicating an intensity of fluorescent X-rays detected under the influence of the geometry effect through use of an FP method with respect to a virtual sample having a thickness set in advance and being indicated by each of the representative composition and the comparative compositions; and a step of calculating a matrix correction coefficient for each of the analysis components based on the detection intensity.
Public/Granted literature
- US11782000B2 Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer Public/Granted day:2023-10-10
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