Invention Grant
- Patent Title: Frequency characteristic measurement device, controller and frequency characteristic measurement method
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Application No.: US16783685Application Date: 2020-02-06
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Publication No.: US11698656B2Publication Date: 2023-07-11
- Inventor: Wei Luo , Tsutomu Nakamura
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP 19066353 2019.03.29
- Main IPC: G06F1/02
- IPC: G06F1/02 ; G01R27/32 ; G05B19/408 ; G05B19/37

Abstract:
A frequency characteristic measurement device that measures the frequency characteristic of a measurement target includes: a multi-sine signal generation unit that generates a multi-sine signal; a sweep sinusoidal wave generation unit that generates a plurality of sweep sinusoidal waves; an input signal switching unit that selects any one of the multi-sine signal and the sweep sinusoidal waves so as to input the selected one to the measurement target; a data acquisition unit that acquires, at a predetermined sampling frequency, sampling data of an input signal which is input to the measurement target and sampling data of an output signal which is output from the measurement target; and a characteristic calculation unit that calculates a frequency characteristic including the gain and the phase of the input and output signals in the measurement target from the sampling data of the input and output acquired.
Public/Granted literature
- US20200310485A1 FREQUENCY CHARACTERISTIC MEASUREMENT DEVICE, CONTROLLER AND FREQUENCY CHARACTERISTIC MEASUREMENT METHOD Public/Granted day:2020-10-01
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