Invention Grant
- Patent Title: Methods for error count reporting with scaled error count information, and memory devices employing the same
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Application No.: US17372453Application Date: 2021-07-10
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Publication No.: US11698831B2Publication Date: 2023-07-11
- Inventor: Matthew A. Prather , Randall J. Rooney
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/10 ; G06F11/07 ; G11C13/00

Abstract:
An apparatus comprising a memory array including a plurality of memory cells arranged in a plurality of columns and a plurality of rows is provided. The apparatus further comprises circuitry configured to perform an error detection operation on the memory array to determine a raw count of detected errors, to compare the raw count of detected errors to a threshold value to determine an over-threshold amount, to scale the over-threshold amount according to a scaling algorithm to determine a scaled error count, and to store the scaled error count in a user-accessible storage location.
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