Invention Grant
- Patent Title: Evaluating surrogate machine learning models
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Application No.: US16689414Application Date: 2019-11-20
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Publication No.: US11699071B2Publication Date: 2023-07-11
- Inventor: Lukasz G. Cmielowski , Wojciech Sobala , Rafal Bigaj , Maksymilian Erazmus
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent James L. Olsen
- Main IPC: G06N3/08
- IPC: G06N3/08 ; G06N3/04 ; G06N5/022

Abstract:
A first machine learning model processes a set of inputs to generate a first set of results. Based on that first set of results, a quality control range is calculated. A second machine learning model calculates a mean accuracy of a second set of results, based on the set of inputs. A determination of whether the mean accuracy of the second set of results is within the quality control range is made, and a user is notified of that determination.
Public/Granted literature
- US20210150336A1 EVALUATING SURROGATE MACHINE LEARNING MODELS Public/Granted day:2021-05-20
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