Invention Grant
- Patent Title: Integrated circuit structure with capacitor electrodes in different ILD layers, and related methods
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Application No.: US17151346Application Date: 2021-01-18
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Publication No.: US11699650B2Publication Date: 2023-07-11
- Inventor: Alamgir M. Arif , Sunil K. Singh , Dewei Xu , Seung-Yeop Kook , Roderick A. Augur
- Applicant: GLOBALFOUNDRIES U.S. Inc.
- Applicant Address: US CA Santa Clara
- Assignee: GlobalFoundries U.S. Inc.
- Current Assignee: GlobalFoundries U.S. Inc.
- Current Assignee Address: US NY Malta
- Agency: Hoffman Warnick LLC
- Agent Anthony Canale
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L49/02

Abstract:
Embodiments of the disclosure provide an integrated circuit (IC) structure. With capacitor electrodes in different ILD layers. The structure includes a first inter-level dielectric (ILD) layer having a top surface, a first vertical electrode within the first ILD layer, a capacitor dielectric film on a top surface of the first vertical electrode, a second ILD layer over the first ILD layer, and a second vertical electrode within the second ILD layer and on the capacitor dielectric film. The capacitor dielectric film is vertically between the first vertical electrode and the second vertical electrode.
Public/Granted literature
- US20220230955A1 INTEGRATED CIRCUIT STRUCTURE WITH CAPACITOR ELECTRODES IN DIFFERENT ILD LAYERS, AND RELATED METHODS Public/Granted day:2022-07-21
Information query
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