Invention Grant
- Patent Title: Drive circuit, transducer system, and inspection device
-
Application No.: US17178658Application Date: 2021-02-18
-
Publication No.: US11701687B2Publication Date: 2023-07-18
- Inventor: Tomio Ono , Yutaka Nakai
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Foley & Lardner LLP
- Priority: JP 20145890 2020.08.31
- Main IPC: B06B1/06
- IPC: B06B1/06 ; B06B1/02 ; H03H7/06 ; H10N30/80 ; H03H7/01

Abstract:
According to one embodiment, a drive circuit includes a first circuit part. The first circuit part includes a first detecting part, a second detecting part, a first circuit, and a second circuit. The first detecting part is configured to detect a first piezoelectric element current flowing in a first piezoelectric element, and output a first detection signal corresponding to the first piezoelectric element current. The second detecting part is configured to detect a first capacitance element current flowing in a first capacitance element, and output a second detection signal corresponding to the first capacitance element current. The first circuit includes a first input terminal and a second input terminal. The first circuit is configured to apply a first drive signal to the first piezoelectric element and the first capacitance element. The second circuit is configured to supply a first differential signal to the second input terminal.
Public/Granted literature
- US20220062949A1 DRIVE CIRCUIT, TRANSDUCER SYSTEM, AND INSPECTION DEVICE Public/Granted day:2022-03-03
Information query
IPC分类: