Invention Grant
- Patent Title: Temperature readings for memory devices to reduce temperature compensation errors
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Application No.: US17536465Application Date: 2021-11-29
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Publication No.: US11704047B2Publication Date: 2023-07-18
- Inventor: Agostino Macerola , Michele Piccardi , Umberto Siciliani , Tommaso Vali , Enrico Favaro
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
A system includes a memory array, a thermometer, and control logic, operatively coupled with the memory array and the thermometer, to perform operations including causing the thermometer to obtain a first temperature result, monitoring a time since obtaining the first temperature result, determining whether the time satisfies a threshold time condition, in response to determining that the time satisfies the threshold time condition, causing the thermometer to obtain a second temperature result from an automatic temperature reading, determining a difference between the second temperature result and a previously stored temperature result, and filtering the second temperature result based on the difference to obtain a new stored temperature result.
Public/Granted literature
- US20220405002A1 TEMPERATURE READINGS FOR MEMORY DEVICES TO REDUCE TEMPERATURE COMPENSATION ERRORS Public/Granted day:2022-12-22
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