Invention Grant
- Patent Title: Systems and methods for reading machine-readable marks on racks and receptacles
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Application No.: US17399789Application Date: 2021-08-11
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Publication No.: US11704515B2Publication Date: 2023-07-18
- Inventor: David Opalsky
- Applicant: GEN-PROBE INCORPORATED
- Applicant Address: US CA San Diego
- Assignee: GEN-PROBE INCORPORATED
- Current Assignee: GEN-PROBE INCORPORATED
- Current Assignee Address: US CA San Diego
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Agent Charles B. Cappellari
- The original application number of the division: US15332729 2016.10.24
- Main IPC: G06K7/10
- IPC: G06K7/10 ; B01L3/00 ; B01L9/06 ; G01N35/00 ; G06K7/14 ; G06K19/06

Abstract:
A method of reading machine-readable marks on a movable support and object of a sample instrument. The method includes capturing a first image of the moveable support as the moveable support moves from a first position to a second position using an image capture device; determining whether a first fiducial machine-readable mark on the moveable support is in the first image; determining, when the first fiducial machine-readable mark is in the first image, whether a first machine-readable mark on a first object coupled to the moveable support is in the first image at a predetermined position relative to the first fiducial machine-readable mark; and associating information decoded from the first machine-readable mark on the first object with a first location on the moveable support associated with the first fiducial machine-readable mark.
Public/Granted literature
- US20210374370A1 Systems And Methods For Reading Machine-Readable Marks On Racks And Receptacles Public/Granted day:2021-12-02
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