Invention Grant
- Patent Title: 1T1R resistive random access memory, and manufacturing method thereof, transistor and device
-
Application No.: US16896951Application Date: 2020-06-09
-
Publication No.: US11706932B2Publication Date: 2023-07-18
- Inventor: Guofeng Yao , Jian Shen
- Applicant: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN GOODIX TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: J.C. Patents
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H10B63/00 ; H01L21/02 ; H01L21/265 ; H01L21/28 ; H01L23/528 ; H01L29/08 ; H01L29/423 ; H10N70/00

Abstract:
The present disclosure provides a 1T1R resistive random access memory and a manufacturing method thereof, and a device. The 1T1R resistive random access memory includes: a memory cell array composed of multiple 1T1R resistive random access memory cells, each 1T1R resistive random access memory cell including a transistor and a resistance switching device (30). The transistor includes a channel layer (201), a gate layer (204) insulated from the channel layer (201), and a drain layer (203) and a source layer (202) disposed on the channel layer (201), and the drain layer (203) and the source layer (202) are vertically distributed on the channel layer (201). The resistance change device (30) is disposed near the drain layer (203). The disclosure reduces the area of a transistor, thereby significantly improving the memory density of the resistive random access memory.
Public/Granted literature
- US20200303460A1 1T1R RESISTIVE RANDOM ACCESS MEMORY,AND MANUFACTURING METHOD THEREOF, TRANSISTOR AND DEVICE Public/Granted day:2020-09-24
Information query
IPC分类: