A method of generating an integrated circuit includes providing a placing layout of the integrated circuit; generating a routed layout of the integrated circuit, the routed layout includes a layout region with a systematic design rule check (DRC) violation; generating an adjusted routing layout of the integrated circuit by adjusting the layout region with the systematic DRC violation according to a target placement recipe in a plurality of placement recipes; extracting features of the placing layout to obtain an extracted data; extracting features of the layout region with the systematic DRC violation to obtain an extracted routing data; performing a training process upon the extracted data and the extracted routing data to generate a plurality of aggregated-cluster models; and selecting a target aggregated-cluster model from the plurality of aggregated-cluster models by comparing the extracted data to the plurality of aggregated-cluster models.