Invention Grant
- Patent Title: Ultrasound probe, control method of ultrasound probe, and ultrasound probe inspection system
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Application No.: US17035916Application Date: 2020-09-29
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Publication No.: US11712227B2Publication Date: 2023-08-01
- Inventor: Hiroshi Murakami
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: JP 18073183 2018.04.05
- Main IPC: A61B8/00
- IPC: A61B8/00 ; G08C23/00 ; G16H40/67

Abstract:
An ultrasound probe includes a housing; a transducer array housed in the housing; a transmission/reception unit which is housed in the housing, transmits ultrasonic wave from the transducer array, and generates a sound ray signal on the basis of a reception signal acquired by the transducer array; an image information data generation unit which is housed in the housing, and generates image information data on the basis of the sound ray signal generated by the transmission/reception unit; a wireless communication unit which is housed in the housing, and wirelessly transmits the image information data generated by the image information data generation unit; a light emission unit which is housed in the housing, and emits light to an outside of the housing; and a light emission control unit which is housed in the housing, and causes the light emission unit to emit light in synchronization with a transmission timing of the ultrasonic wave by the transmission/reception unit in a case of a manufacturing inspection.
Public/Granted literature
- US20210007718A1 ULTRASOUND PROBE, CONTROL METHOD OF ULTRASOUND PROBE, AND ULTRASOUND PROBE INSPECTION SYSTEM Public/Granted day:2021-01-14
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