Invention Grant
- Patent Title: Optical scanning for industrial metrology
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Application No.: US17307487Application Date: 2021-05-04
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Publication No.: US11712837B2Publication Date: 2023-08-01
- Inventor: Wojciech Matusik , Aaron Weber , Desai Chen , Gregory Ellson , Javier Ramos , Davide Marini
- Applicant: Inkbit, LLC
- Applicant Address: US MA Medford
- Assignee: Inkbit, LLC
- Current Assignee: Inkbit, LLC
- Current Assignee Address: US MA Medford
- Agency: Occhiuti & Rohlicek LLP
- Main IPC: B29C64/112
- IPC: B29C64/112 ; G01N21/88 ; G02B26/10 ; B29C64/40 ; B29C64/268 ; B33Y10/00 ; B29K105/00

Abstract:
A method for additive manufacturing includes forming an object including depositing a first material including a first coloring component and a second material including a second coloring component, wherein both the first material and the second material further include a corresponding fluorescent component, scanning the object, including causing an emission of an optical signal from the object, wherein the emission of the optical signal is caused at least in part by an emission from the fluorescent components interacting with the first coloring component and the second coloring component as it passes from the fluorescent components to the surface of the object, sensing the emission of the optical signal, and determining presence of the first material and the second material based at least in part on the sensed emission of the optical signal.
Public/Granted literature
- US20210252775A1 OPTICAL SCANNING FOR INDUSTRIAL METROLOGY Public/Granted day:2021-08-19
Information query
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